摘要
针对微米级颗粒透射电镜样品,本文详细介绍了一种操作简单、实用性强的制备方法。TEM表征结果表明,采用该方法可以成功制备出微米级颗粒的适合TEM观察的样品。
Aiming at the transmission electron microscope(TEM)specimens of micro-grade particles,a preparation method with a simple operation and a high practicality was introduced.The TEM results indicated that by using this method it could succeed in preparing TEM specimens for micro-grade particles.
作者
马秀梅
尤力平
MA Xiu-mei;YOU Li-ping(Electron Microscopy Laboratory,School of Physics,Peking University,Beijing 100871,China)
出处
《电子显微学报》
CAS
CSCD
北大核心
2018年第2期201-204,共4页
Journal of Chinese Electron Microscopy Society
关键词
透射电镜
微米颗粒
制样
离子减薄
TEM
micro-grade particles
specimen preparation
ion milling
作者简介
马秀梅（1979-),女（汉族），河北人,工程师.E-mail:ma_xm@pku.edu.cn
