摘要
以纳米碳酸钙粒子作为测量对象,分别采用X射线衍射法(XRD)、透射电子显微镜法(TEM)及原子力显微镜法(AFM)测量其粒径。结果表明:X射线衍射法测量的纳米粒子粒径可能小于纳米粒子实际平均粒径,透射电子显微镜法和原子力显微镜法测量的纳米粒子粒径可能大于纳米粒子实际平均粒径。分析探讨了3种方法的应用领域、测量范围、优缺点等。
Taking the nano calcium carbonate particle as the object of measurement, and adopting the X ray diffraction （XRD） method, the transmission electronic microscope （TEM） method and the atomic force microscope （AFM） method to measure the diameter of its particle. The result indicated that the particle diameter of nano particle measured by the X ray diffraction method may be smaller than the actual average particle diameter of nano particle, the particle diameter of nano particle measured by the transmission electronic microscope method and the atomic force microscope method may be larger then the actual average particle diameter of nano particle. Three kinds of methods were analyzed and discussed on there domains of application, ranges of measurement and virtues and defects etc.
出处
《机械设计》
CSCD
北大核心
2008年第5期12-14,共3页
Journal of Machine Design
基金
上海市教委科研资助项目(06FZ008)
上海市教委重点学科建设资助项目(J50603)
关键词
纳米粒子
X射线衍射法
透射电子显微镜法
原子力显微镜法
粒径
nano particle
X ray diffraction method
transmission electronic microscope method
atomic force microscope method
particle diameter
作者简介
顾彩香（1964-），女，上海人，硕士，副教授，研究方向：材料科学、摩擦学等，发表论文30余篇。
