摘要
以美国亚德诺半导体技术有限公司bipolar/I2L工艺的1^(2)位模拟数字转换器AD574为研究对象,在^(60)Coγ辐照条件下累积400 Gy(Si)的电离剂量(Totalionizingdose,TID),对累积总剂量前后的样品进行激光单粒子翻转(Single-event upset,SEU)试验,获得了0 V、1 V、2.5 V输入信号条件下的输出码值翻转。结果显示:累积400 Gy(Si)电离剂量后,AD574输出码值的翻转向中心码值右侧偏移,同时造成翻转次数的改变。本文初步分析了AD574的TID-SEU协合效应作用机制,认为该现象与模拟/数字转换器内部比较器单粒子瞬态的敏感性有关。累积总剂量后,比较器单粒子瞬态的幅值和宽度显著增大,会导致AD574输出码值翻转分布及次数的变化。该TID-SEU协合效应研究对宇航元器件的抗辐射加固保障提供了有益参考。
This study investigates the AD 574,a 12-bit analog/digital converter(ADC)produced by American Analog Devices,Inc.(ADI)using bipolar/I^(2)L technology.The test samples are subjected to a total ionizing dose(TID)of 400 Gy(Si)under^(60)Coγirradiation.The samples with and without the TID are then subjected to a single event upset(SEU)test,and the upset times of the output codes under the input signal conditions of 0 V,1 V,and 2.5 V are obtained.The test results indicate that,after accumulating a total dose of 400 Gy(Si),the upset of the AD 574 output code shifts toward the right of the center code value,resulting in a change in the upset times.Furthermore,the mechanism of the TID-SEU synergistic effect for the AD 574 is preliminarily analyzed;it is believed that this phenomenon is related to the sensitivity of the ADC internal comparator single-event transient(SET).The amplitude and width of the SET pulse of the comparator with the TID increase significantly;this causes a change in the AD 574 output code value upset distribution and the number of upset times.This study on the TID-SEU synergistic effect serves as a useful reference for aerospace components with radiation hardness.
作者
相传峰
姚帅
于新
李小龙
陆妩
王信
刘默寒
孙静
郭旗
蔡娇
杨圣
XIANG Chuanfeng;YAO Shuai;YU Xin;LI Xiaolong;LUWu;WANG Xin;LIU Mohan;SUN Jing;GUO Qi;CAI Jiao;YANG Sheng(College of Physics Science and Technology,Xinjiang University,Urumqi 830046,China;Key Laboratory of Functional Materials and Devices for Special Environments,Xinjiang Technical Institute of Physics and Chemistry,Chinese Academy of Sciences,Urumqi 830011,China;Xinjiang Key Laboratory of Electronic Information Material and Device,Xinjiang Technical Institute of Physics and Chemistry,Chinese Academy of Sciences,Urumqi 830011,China;University of Chinese Academy of Sciences,Beijing 100049,China)
出处
《辐射研究与辐射工艺学报》
CAS
CSCD
2021年第4期91-96,共6页
Journal of Radiation Research and Radiation Processing
基金
国家自然科学基金(11805270、U1532261、12005293)
中科院西部之光项目(2018-XBQNXZ-B-003)资助。
作者简介
第一作者:相传峰,男,1995年11月出生,2018年6月毕业于烟台大学核工程与核技术专业,目前为新疆大学硕士研究生;通信作者:陆妩,研究员,博士生导师,E-mail:luwu@ms.xjb.ac.cn。
