摘要
针对一种LDO,研究了重离子Cl、Ge辐照触发的单粒子闩锁(SEL)效应。实验结果表明,输入1.8 V时,SEL电流范围为850~950 mA;输入3.3 V时,SEL电流范围为6.2~6.4 mA。随着限制电流值的增高,退出SEL的时间逐渐增大,最终无法退出。该LDO的SEL维持电流范围为350~400 mA,可通过正常工作电流和允许的中断时间来选择合适的限制电流值。
Single event latch-up(SEL)effects of a LDO ttriggered by Cl and Ge irradiation were studied.The experimental results showed that the SEL current range was 850~950 mA when the input voltage was 1.8 V,and the SEL current range was 6.2~6.4 mA when the input voltage was 3.3 V.As the limit current value was increased,the time to exit the SEL gradually increased and eventually could not be exited.The holding current range of the LDO device’s SEL was 350~400 mA.A suitable limiting current value could be selected based on the device’s normal operating current demand and the allowable interrupt time.
作者
夏鹏
杨少华
吴福根
雷志锋
张战刚
XIA Peng;YANG Shaohua;WU Fugen;LEI Zhifeng;ZHANG Zhangang(School of Materials and Energy,Guangdong Univ.of Technology,Guangzhou510006,P.R.China;Key Lab.of Reliab.Phys.and Appl.Technol.for Elec.Compon.,Fifth Inst.of Elec.,Ministry of Industry and Inform.Technol.,Guangzhou510610,P.R.China)
出处
《微电子学》
CAS
北大核心
2020年第1期148-152,共5页
Microelectronics
基金
广东省省级科技计划项目(2017B090921001,2017B090901068)
广州市科技计划项目(201707010186).
作者简介
夏鹏(1993—),男(汉族),安徽宣城人,硕士研究生,研究方向为电源芯片的辐射效应;通信作者:张战刚(1986—),男(汉族),高级工程师。E-mail:zhangangzhang@163.com。
