摘要
根据光线穿过厚度均匀的透明介质平板时所产生的横向偏移量,提出了一种利用线阵CCD和计算机测量透明介质折射率的新方法.该方法充分利用了线阵CCD分辨率高的特点,并且具有一定的实用价值和应用前景.
According to the traverse deviation of light caused by passing through a transparent medium plate of even thickness, a new method of measuring index of refraction of transparent medium by means of CCD and computer is proposed. This method uses linear array CCD characteristic with high resolution capacity and has certain practical value and application prospect.
出处
《大学物理》
北大核心
2004年第6期51-53,共3页
College Physics
关键词
CCD
透明介质
折射率
CCD
transparent medium
index of refraction
