摘要
研究了Y5V多层陶瓷电容器(MLCC)在直接浸泡和电化学注氢两种作用下的低频介电性能。结果表明直接浸泡对样品性能的影响很小,这与电子元器件成品的封装技术造成的保护作用有关。然而电化学注氢会对样品造成显著的影响,样品的电容值会随之减小,同时其介电损耗及漏电流增大,这是由于电化学注氢过程中所产生的氢离子会沿着电容器的电极进入元件内部,从而与原材料产生作用造成的,这种作用效果会随着电容器的多层结构而显著表现出来。
Degradation of low frequency dielectric properties in Y5 V multi layer ceramics capacitor have been studied. Two groups of sample were immersed in a 0.01 mol/L Na OH solution only and with electrochemical hydrogen charging. Samples which were immersed only showed little change during treating period. On the other hand, samples which were immersed with electrochemical hydrogen charging have significant changes in capacitance decreasing, dielectric loss increasing and leakage current increasing. It was proposed that hydrogen ions which were generated in electrochemical hydrogen charging could diffuse into capacitor though electrodes. By means of reactions between electrodes and basic materials, these effects could be enhanced by the multi layer structure in MLCC.
出处
《中国陶瓷》
CAS
CSCD
北大核心
2015年第3期54-57 65,65,共5页
China Ceramics
基金
国家自然科学基金项目(11304069)
海南省自然科学基金项目(114009)
海南省高等学校科学研究项目(Hjkj2013-24)
海南师范大学拟建物理学硕士点项目(20140092102)
关键词
Y5V
多层陶瓷电容器
低频介电性能
失效
Y5V
Multi layer ceramics capacitor
Low frequency dielectric properties
Degradation
