期刊文献+

热老化对电缆接头中典型缺陷引发的电场畸变的影响 被引量:7

Effect of thermal aging on electric field distortion induced by typical defects in cable intermediate joints
在线阅读 下载PDF
导出
摘要 采用COMSOL Multiphysics有限元仿真软件,研究了在热老化过程中35 kV电缆中间接头缺陷的电场分布规律变化,针对电缆中间接头中易出现的预制件破损、主绝缘表面划痕、半导电层凸起、绝缘层杂质及水树枝等5种缺陷的电场分布进行研究。结果表明:在5种缺陷引发的场强畸变中,水树枝最为明显,为无缺陷时的5.4倍,主绝缘表面划痕最小,为无缺陷时的1.2倍。对XLPE和SIR两种材料进行加速热老化试验并将数据带入仿真模型得出:两种材料的介电常数和电导率劣化速率不同,电场畸变的规律也会随之发生变化,老化对半导电杂质缺陷电场畸变程度影响最大,老化384 h后该缺陷处电场强度是未老化的1.5倍。 COMSOL Multiphysics finite element simulation software was used to study the changes in the electric field distribution pattern of defects in 35 kV cable joints during the thermal aging process,including broken prefabricated parts,scratches on the surface of the main insulation,protrusions in the semi-conducting layer,impurities in the insulation layer and water trees.The results show that:Among the electric field distortion caused by five kinds of defects,the water tree is the most obvious,which is 5.4 times of that without defects,and the main insulation surface scratches is the least obvious,1.2 times of that without defects.Accelerated thermal aging test on XLPE and SIR materials and bring the data into the simulation model to obtain:the rate of dielectric constant and conductivity deterioration of the two materials is different,and the law of electric field distortion will change;and aging has the greatest effect on the degree of electric field distortion of semi-conducting impurity defects;the electric field strength at the defect is 1.5 times higher than that without aging after 384 hours of aging.
作者 张瑞祥 李欢 张延伟 石迎新 ZHANG Rui-xiang;LI Huan;ZHANG Yan-wei;SHI Ying-xin(School of Electrical Engineering,Shaanxi University of Technology,Hanzhong 723000,China)
出处 《陕西理工大学学报(自然科学版)》 2023年第2期14-21,共8页 Journal of Shaanxi University of Technology:Natural Science Edition
基金 陕西省教育厅一般专项计划项目(22JK0322) 中国电力科学研究院有限公司武汉分院科研项目(CYW51201800194) 国网江苏省电力有限公司电力科学研究院科研项目(SGJSDK00ZPJS1800362) 陕西理工大学研究生创新基金项目(SLGYCX2236)。
关键词 电缆中间接头 典型缺陷 电场畸变 有限元仿真 热老化 cable intermediate joints typical defects electric field distortion finite element simulation thermal aging
作者简介 通信作者:李欢(1988-),男,陕西汉中人,副教授,主要研究方向为固体电介质劣化及破坏机理。
  • 相关文献

参考文献16

二级参考文献243

共引文献325

同被引文献91

引证文献7

二级引证文献13

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部