摘要
针对芯片测试过程中自动测试设备需要向被测芯片传输大量测试数据的问题,提出了一种引导测试向量自动生成广义折叠集的方法.该方法根据信号值计算对应的原始输入,在测试生成中嵌入广义折叠技术,确保按广义折叠规律生成广义折叠集,将原始测试数据的直接存储转换成对广义折叠集种子和折叠距离的间接存储.硬故障测试集实验结果显示,在同等实验环境下,所提方法的压缩率相对于传统的广义折叠技术平均提高了1.17%.Mintest故障集实验结果显示,相对于国际上通用的Golomb码、FDR码、VIHC码和EFDR码,所提方法的压缩率分别提高了22.45%,17.01%,14.40%和11.91%.
To solve the problem that automatic test equipments need to transmit a large amount of test data to the chip during tests,an automatical generation method of generalized folding sets by guiding test patterns is proposed.According to the value of a signal line,the corresponding original inputs are calculated.The generalized folding technique is embeded during the test generation to ensure that the generalized folding set is generated by the law of the generalized folding.The direct storage of the original test data is converted into the indirect storage of the seed and folding distances of the generalized folding sets.The experimental results of the hard fault test set show that in the same experimental environments,compared with the traditional generalized folding technique,the average compression rate of the proposed method increases by 1.17%.The experimental results of the Mintest fault set show that compared with the globally popular Golomb code,the frequency-directed run-length(FDR)code,the variable-length input huffman code(VIHC)and the extended frequency-directed run-length(EFDR)code,the compression rates of the proposed method are increased by 22.45%,17.01%,14.40%and 11.91%,respectively.
作者
詹文法
程一飞
吴海峰
江健生
Zhan Wenfa ;Cheng Yifei ;Wu Haifeng ;Jiang Jiansheng(School of Computer Science and Information,Anqing Normal University,Anqing 246133,China)
出处
《东南大学学报（自然科学版）》
EI
CAS
CSCD
北大核心
2018年第2期265-269,共5页
Journal of Southeast University：Natural Science Edition
基金
国家自然科学基金资助项目(61306046
61640421)
关键词
广义折叠集
折叠集
测试数据压缩
自动测试向量生成
generalized folding set
folding set
test data compression
automatic test pattern generation
作者简介
詹文法(1978—)，男,博士,教授,zhanwf@aqnu.edu.cn.[
