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Black phosphorus-based field effect transistor devices for Ag ions detection 被引量:5

Black phosphorus-based field effect transistor devices for Ag ions detection
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摘要 Black phosphorus (BP), an attractive two-dimensional (2D) semiconductor, is widely used in the fields of optoelec- tronic devices, biomedicine, and chemical sensing. Silver ion (Ag+), a commonly used additive in food industry, can sterilize and keep food fresh. But excessive intake of Ag+ will harm human health. Therefore, high sensitive, fast and simple Ag+ detection method is significant. Here, a high-performance BP field effect transistor (FET) sensor is fabricated for Ag+ detection with high sensitivity, rapid detection speed, and wide detection concentration range. The detection limit for Ag+ is 10 l0 mol/L. Testing time for each sample by this method is 60 s. Besides, the mechanism of BP-FET sensor for Ag+ detection is investigated systematically. The simple BP-FET sensor may inspire some relevant research and potential applications, such as providing an effective method for the actual detection of Ag+, especially in wimessed inspections field of food. Black phosphorus (BP), an attractive two-dimensional (2D) semiconductor, is widely used in the fields of optoelec- tronic devices, biomedicine, and chemical sensing. Silver ion (Ag+), a commonly used additive in food industry, can sterilize and keep food fresh. But excessive intake of Ag+ will harm human health. Therefore, high sensitive, fast and simple Ag+ detection method is significant. Here, a high-performance BP field effect transistor (FET) sensor is fabricated for Ag+ detection with high sensitivity, rapid detection speed, and wide detection concentration range. The detection limit for Ag+ is 10 l0 mol/L. Testing time for each sample by this method is 60 s. Besides, the mechanism of BP-FET sensor for Ag+ detection is investigated systematically. The simple BP-FET sensor may inspire some relevant research and potential applications, such as providing an effective method for the actual detection of Ag+, especially in wimessed inspections field of food.
作者 Hui-De Wang David K Sanf Zhi-Nan Guo Rui Cao Jin-Lai Zhao Muhammad Najeeb Ullah Shah Tao-Jian Fan Dian-Yuan Fanl Han Zhang 王慧德;David K Sang;郭志男;曹睿;赵劲来;Muhammad Najeeb Ullah Shah;范涛健;范滇元;张晗(Shenzhen Key Laboratory of Two-Dimensional Materials and Devices, Shenzhen Engineering Laboratory of Phosphorene and Optoelectronics,SZU-NUS Collaborative Innovation Center for Optoelectronic Science & Technology, College of Optoelectronic Engineering,Shenzhen University;Faculty of Information Technology, Macao University of Science and Technology)
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第8期35-41,共7页 中国物理B(英文版)
基金 Project support by the National Natural Science Foundation of China(Grant Nos.61605131 and 61435010) the Shenzhen Science and Technology Research Fund,China(Grant No.JCYJ20150324141711624)
关键词 black phosphorus semiconductor devices chemical sensing witnessed inspections black phosphorus semiconductor devices chemical sensing witnessed inspections
作者简介 Correspondingauthor.E—mail:guozhinan@szu.edu.cn;Corresponding author. E-mail: hzhang@szu.edu.cn
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