摘要
液晶屏显示驱动芯片广泛应用于数码产品领域,近年来与之配套的驱动芯片的需求量也大幅度增加。驱动芯片测试贯穿在芯片的设计、制造与应用的全过程中,是保证芯片品质的重要手段。由于驱动芯片不同于一般的通用芯片,通用测试手段无法用于该类芯片的测试,目前该技术主要掌握在国外企业手中,因此在驱动芯片设计与制造的产业链中,测试技术已成为制约发展的一个瓶颈。针对此背景,本文提出一套高效、实用测试方法,采用多通道与高压模拟通道同步测试技术、色阶测试技术、特殊封装的适应性技术和ATE等技术,可以实现减少测试费用、提高驱动芯片测试吞吐量的同时也能保证客户对芯片质量的严格要求。
LCD display driver chip is widely used in the field of digital products,in recent years,the driving chip demand has a substantial increase.Drive chip testing throughout the whole design, manufacturing and application process, the chip test is an important means to ensure the quality of the chip. The driver is different from the general chip,so general test methods cannot be used for this type of chip,at present this technology is mainly hold by foreign companies. Therefore, in the design and manufacture of driving chip industry chain,testing technology has become a bottleneck which restricted the industrial development. Under this background, there proposed a set of effective and practical test method, which can effectively ensure product quality and reduce the cost of chip test at the same time by using multi channel, high voltage simulation channels synchronous test technology, color gradation test technology,special package technology adaptability and ATE technology.This method can make fast and accurate testing of all kinds of driving chips.
出处
《数字技术与应用》
2016年第4期59-61,共3页
Digital Technology & Application
作者简介
濮德龙（1964-），男，江苏南京人，本科，高级工程师，毕业于北京邮电大学，研究方向：微电子测试。
