期刊文献+

基于维纳过程金属化膜电容器的剩余寿命预测 被引量:27

Residual Life Forecasting of Metallized Film Capacitor Based on Wiener Process
在线阅读 下载PDF
导出
摘要 金属化膜电容器是惯性约束聚变激光装置能源系统最重要的元器件,对个体电容器的剩余寿命进行有效的预测对整个装置的可靠性水平有着重要的影响。为有效地预测个体电容器的剩余寿命,提出了融合单个电容器性能退化数据与先验性能退化数据信息的预测方法。采用Wiener过程对其性能退化过程进行建模,并根据先验退化数据信息构造参数的先验分布,由Bayes方法融合个体退化数据实现剩余寿命的实时预测,通过一个实例表明了本文的研究意义和实用价值。 The metallized film capacitor is one of the most important components of the inertial confinement fusion (ICF) facility. The effective residual life forecasting of capacitors effects the reliability of the whole facility. In order to forecast the residual life of a single capacitor effectively, a method which fuses prior degradation information and its own degradation data was presented. Firstly, the capacitor's degradation process was modeled with Wiener process, whose parameter' s prior distribution was established on the basis of prior degradation information. Then the real-time residual life forecasting of the capacitor was proposed by Bayes method. Finally, the significance and practical value of this research was verified by an example.
出处 《国防科技大学学报》 EI CAS CSCD 北大核心 2011年第4期146-151,共6页 Journal of National University of Defense Technology
基金 国家自然科学基金资助项目(60904002)
关键词 金属化膜电容器 维纳过程 贝叶斯方法 剩余寿命预测 metallized film capacitor wiener process bayes method residual life forecasting
作者简介 王小林(1985-),男,博士生。
  • 相关文献

参考文献17

二级参考文献50

  • 1孙权,钟征,周经伦,魏晓峰,赵建印,郭良福,周丕璋,力一峥,陈德怀.自愈式金属化膜脉冲电容器耗损失效模型[J].强激光与粒子束,2004,16(8):1000-1004. 被引量:25
  • 2赵建印,刘芳,孙权,周经伦.基于性能退化数据的金属化膜电容器可靠性评估[J].电子学报,2005,33(2):378-381. 被引量:26
  • 3郭大德.金属化膜电容器的损耗分析及损坏机理[J].电力电容器,1995(2):12-15. 被引量:29
  • 4张永强,刘琦,周经伦.小子样条件下基于Normal-Poisson过程的性能可靠性评定[J].国防科技大学学报,2006,28(3):128-132. 被引量:5
  • 5Ennis J B, MacDougall F W, Cooper R A, et al. Self-healing pulse capacitors for the National Ignition Facility(NIF) [C]//Proc of 12th IEEE International Pulsed Power Conference. 1999:118-121.
  • 6Larson D W, Macdougall F W, Hardy P, et al. The impact of high energy density capacitors with metallized electrode in large capacitor banks for nuclear fusion applieation[C]//Proc of 9th IEEE International Pulsed Power Conference. 1993:735-742.
  • 7Merritt B T, Whitham K. Performance and cost analysis of large capacitor banks using Weibull statistics and MTBF[C]//Proc 3rd of IEEE International Pulsed Power Conference. 1981.
  • 8Sun Quan, Zhou Jinglun, Zhong Zheng, et al. Gauss-Poisson joint distribution model for degradation failure[J]. TEEE Trans on Plasma Science, 2004,32(5) : 1864-1868.
  • 9Zhao Jianyin, Liu Fang. Reliability assessment of the metallized film capacitors from degradation data[J]. Microelectronic Reliability,2007, 47(2-3) :434-436.
  • 10Chikkara R S, Folks J L. The inverse Gaussian distribution[M]. New York: Marcell Dekker, 1989.

共引文献83

同被引文献272

引证文献27

二级引证文献233

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部