摘要
利用衰减法,设计了以第一电离室的计数归一化入射光束强度,用成像板计数单位记录入射光束强度的方案,并用Si片衰减进行了实验,结果表明本文提出的方案能够获得合理的绝对强度.
The intensity is calibrated with image plate count unit, and is normalized by the count of an ion chamber positioned in front of the Absorption foils. Silicon foils are used to carry out the experiment, and the results demonstrate that the experimental scheme can obtain reasonable Absolute intensity.
出处
《物理实验》
2005年第4期37-39,共3页
Physics Experimentation
关键词
小角散射
绝对强度
衰减法
成像板
small-angle scattering
Absolute intensity
attenuation method
image plate
