摘要
Raman scattering measurements on Se-doped GaAs epitaxial layers and semi-insulating (SI) GaAs irradi-ated by 10 Mev electrons have been investigated. Several defect-related features were observed. We suggestthat the 220 cm ￣-1mode is attribute to As_1 which is associated, at least in part, with EL2 and EL12 defects.For Sedoped samples, the Raman peaks at 205 and 258 cm￣-1 may be due to vibrational modes in small clus-ters of arsenic, and the 77 and 185 ￣-1modes are probably associated with disorder-activated first order Ra-man scattering.Irradiated results show that the small clusters of arsenic and disorder state are increased with in-creasing irradiation fluences. Other Raman peaks will also be discussed in this paper.
Raman scattering measurements on Se-doped GaAs epitaxial layers and semi-insulating (SI) GaAs irradi-ated by 10 Mev electrons have been investigated. Several defect-related features were observed. We suggestthat the 220 cm ￣-1mode is attribute to As_1 which is associated, at least in part, with EL2 and EL12 defects.For Sedoped samples, the Raman peaks at 205 and 258 cm￣-1 may be due to vibrational modes in small clus-ters of arsenic, and the 77 and 185 ￣-1modes are probably associated with disorder-activated first order Ra-man scattering.Irradiated results show that the small clusters of arsenic and disorder state are increased with in-creasing irradiation fluences. Other Raman peaks will also be discussed in this paper.
