摘要
阐述了电子电器产品小子样情况下可靠性评估方法的研究现状。首先,通过国内外文献归纳,指出电子电器产品小子样情况下可靠性评估问题主要包括小子样数据预处理及可靠性预测建模两个方面;然后,根据上述问题介绍了目前应用的几种可靠性评估方法:Bootstrap法、Bayes法等,并分析各方法的优缺点;最后,对于电子电器产品小子样情况下可靠性评估方法研究进行了展望。
The research status of reliability evaluation methods of electronic and electrical products with small samples is expounded.First of all,through the literature review at home and abroad,it is pointed out that the reliability evaluation of electronic and electrical products with small samples mainly includes two aspects:data preprocessing of small samples and reliability prediction modeling.Then,according to the above problems,several reliability evaluation methods,such as Bootstrap method and Bayes method are introduced,and their advantages and disadvantages are analyzed.Finally,the research on reliability evaluation methods of electronic and electrical products with small samples is prospected.
作者
朱佳淼
王召斌
李久鑫
ZHU Jiamiao;WANG Zhaobin;LI Jiuxin(College of Automation,Jiangsu University of Science and Technology,Zhenjiang 212003,China)
出处
《电器与能效管理技术》
2022年第12期1-7,12,共8页
Electrical & Energy Management Technology
基金
国家自然科学基金资助项目(51507074)
关键词
电子电器产品
小子样
可靠性
评估方法
electronic and electrical products
small samples
reliability
evaluation method
作者简介
朱佳淼(1999—),男,硕士研究生,研究方向为航天电器小子样情况下可靠性评估问题研究;王召斌(1982—),男,副教授,研究方向为电器贮存可靠性、加速试验及寿命预测技术;李久鑫(1998—),男,硕士研究生,研究方向为继电器可靠性及寿命预测。
