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镀Ni管壳侧壁硅橡胶粘接开裂机理研究 被引量:2

Research on the Mechanism of Silica-Gel Cracking on the Side Wall of Nickel Plated Metallic Package
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摘要 A型号硅橡胶粘接在镀Ni管壳侧壁后存在开裂情况,包括初始加工后胶点开裂、经历单次清洗后开裂,以及经历随机振动等可靠性试验后开裂,这会导致连接失效等一系列可靠性问题。文章针对A型号硅橡胶在镀Ni管壳侧壁引线加固时出现开裂的问题,进行了引线粘接极限破坏力理论计算、不同胶点直径和粘胶间距的仿真,以及等离子清洗提升表面能等研究。研究结果表明,优化引线粘接结构并对镀Ni管壳进行等离子体清洗可以明显提升A型号硅橡胶在镀Ni管壳侧壁粘接的可靠性。相关研究结果可以用于A型号硅橡胶实际生产。 Silica gel has cracking phenomena on the side wall of nickel-plated tube shell,which mainly includes glue dot cracking during the first adhesion processing,cracking after a single cleaning,cracking after random vibration in reliability experiment,etc.Those cracking issues will further lead to a series of reliability problems such as connection failure.In this paper,the theoretical calculation of the ultimate destructive force of bonding,the simulation calculation of adhesive with different dot diameters and different spacing adhesives,and the surface energy improvement caused by plasma cleaning were carried out in view of the cracking problem of Ni-plated shell sidewall reinforcement of type A silica gel.The results show that optimizing the bonding structure of the wire-glue module and cleaning of the nickel-plated shell with plasma can significantly improve the reliability of the sidewall bonding of type A silica gel on the sidewall of the nickel-plated shell.The relevant research results can be used in the actual production practice of A type silica gel.
作者 陈容 肖玲 陆科 罗驰 廖希异 胡彦斌 张颖 崔伟 CHEN Rong;XIAO Ling;LU Ke;LUO Chi;LIAO Xiyi;HU Yanbin;ZHANG Ying;CUI Wei(National Laboratory of Science and Technology on Analog Integrated Circuit,Chongqing 400060,P.R.China;The 24th Research Institute of China Electronics Technology Group Corp.,Chongqing 400060,P.R.China)
出处 《微电子学》 CAS 北大核心 2023年第5期938-944,共7页 Microelectronics
基金 国家自然科学基金资助项目(12105252)
关键词 硅橡胶 镀Ni管壳 表面能 开裂 silica gel nickel-plated metallic package surface energy cracking
作者简介 陈容(1987—),女,(汉族),重庆人,硕士,高级工程师,从事微系统封装工艺技术研究工作。
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