目的以课题组纯化获得的蛋白样本为观察对象,对比原子力显微镜(atomic force microscope,AFM)及扫描电子显微镜(scanning electron microscope,SEM)的观察结果,并总结AFM观察生物大分子的主要问题和解决方法。方法将蛋白样本使用PBS稀释...目的以课题组纯化获得的蛋白样本为观察对象,对比原子力显微镜(atomic force microscope,AFM)及扫描电子显微镜(scanning electron microscope,SEM)的观察结果,并总结AFM观察生物大分子的主要问题和解决方法。方法将蛋白样本使用PBS稀释至15 nmol·L^(-1),分别固定于载玻片、硅片和云母片上烘干,制成固相观察样本,SEM样本在观察前镀铂,使用AFM及SEM观察蛋白质表面结构,计算样本高度,对比结果差异。结果带正电的蛋白样本在观察时由于AFM探针的斥力会向右偏移;云母片能很好地消除蛋白正电荷从而避免样本移动;PBS能为蛋白样本提供良好的稳定环境,但PBS盐结晶会干扰探针运行和成像清晰度;SEM样本需要镀铂后观察,无法达到AFM的精度。结论使用AFM和SEM均可在体外环境直接观察蛋白质结构,AFM能提供更高精度的观察结果;在蛋白样本稳定性允许的情况下首选超纯水为溶剂载体,乙醇等挥发性液体也可作为溶剂载体,AFM的应用可为药理学生物大分子互作研究提供一新途径。展开更多
为解决原子力显微镜(Atomic Force Microscope,AFM)系统更换探针后光路调整复杂耗时、精度不足的问题,本文首次提出通过精密控制探针与探针夹装配位置来实现更换的探针相对AFM系统原光路位置的一致,进而实现免去AFM系统换针后调整光路...为解决原子力显微镜(Atomic Force Microscope,AFM)系统更换探针后光路调整复杂耗时、精度不足的问题,本文首次提出通过精密控制探针与探针夹装配位置来实现更换的探针相对AFM系统原光路位置的一致,进而实现免去AFM系统换针后调整光路步骤。该系统的光路一致性组件采用光束偏转法对探针位置与偏转进行放大与监测,并使用高精度位移与角度调节平台进行探针相对于探针夹的方位调整。通过实物搭建对探针一致性效果进行了验证,并对紫外光(Ultraviolet,UV)胶水固化过程导致探针位置偏移影响;探针不同偏移量时产生的探测器噪音对AFM系统成像质量影响进行了系统分析。实验结果表明:经由该系统装配的探针平均位置精度接近1.1μm;并且在AFM系统中更换一致性探针仅需8 s。该系统实现了高精度且质量稳定的探针一致性装配,极大地简化了AFM系统重新校准光路的操作步骤,其与自动换针装置配合可有效提升工业计量型AFM的操作与测量性能。展开更多
Applications of Atomic Force Microscopy (AFM) in optical disc technology are summarized. AFM is ideally suited to the characterization of nanometerscale pit and bump structures in CD/DVD manufacturing, so the relati...Applications of Atomic Force Microscopy (AFM) in optical disc technology are summarized. AFM is ideally suited to the characterization of nanometerscale pit and bump structures in CD/DVD manufacturing, so the relationship between production variables and pits/bumps geometry as well as relations between pits/bumps geometry and electrical performance of discs can be established to perform direct quality control of CD/DVD manufacturing. Applications of AFM in optical disc technology mainly fall into three parts: qualitative analysis of topography of discs/stampers, semiquantitative analysis of pits/bumps geometry of discs/stampers and length analysis of data marks on bump with statistics technology. Qualitative analysis of topography of discs/stampers and semiquantitative analysis of pits/bumps geometry of discs/stampers are chiefly oriented to the measurements of high error rate at beginning of play, pit morphology and block error rate, track pitch variations, pit depth monitoring as well as bump morphology and its surface roughness. It is discovered that the efficiency of the cooling channels of the mold has deteriorated, resulting in the discs being separated from the stamper while they are too soft due to inadequate cooling in the area where high error rate and block error rate are frequently produced. Length analysis of data marks with statistics technology is aimed at the analysis of track pitch and pitch variation, bump length (offset, deviation, asymmetry) and AFM jitter, bump width and width variation, bump height and height variation as well as side wall angle (slope) and slope variation. Statistical analysis of AFM images yields important information about optical disc microstructure and in turn provides information about the performance of the manufacturing process. It is very useful to analyze geometric parameters by considering the fundamental length groups of the data marks. The obtained results demonstrate that AFM have particular advantages in the quality control of discs/stampers manufacturing.展开更多
文摘目的以课题组纯化获得的蛋白样本为观察对象,对比原子力显微镜(atomic force microscope,AFM)及扫描电子显微镜(scanning electron microscope,SEM)的观察结果,并总结AFM观察生物大分子的主要问题和解决方法。方法将蛋白样本使用PBS稀释至15 nmol·L^(-1),分别固定于载玻片、硅片和云母片上烘干,制成固相观察样本,SEM样本在观察前镀铂,使用AFM及SEM观察蛋白质表面结构,计算样本高度,对比结果差异。结果带正电的蛋白样本在观察时由于AFM探针的斥力会向右偏移;云母片能很好地消除蛋白正电荷从而避免样本移动;PBS能为蛋白样本提供良好的稳定环境,但PBS盐结晶会干扰探针运行和成像清晰度;SEM样本需要镀铂后观察,无法达到AFM的精度。结论使用AFM和SEM均可在体外环境直接观察蛋白质结构,AFM能提供更高精度的观察结果;在蛋白样本稳定性允许的情况下首选超纯水为溶剂载体,乙醇等挥发性液体也可作为溶剂载体,AFM的应用可为药理学生物大分子互作研究提供一新途径。
文摘为解决原子力显微镜(Atomic Force Microscope,AFM)系统更换探针后光路调整复杂耗时、精度不足的问题,本文首次提出通过精密控制探针与探针夹装配位置来实现更换的探针相对AFM系统原光路位置的一致,进而实现免去AFM系统换针后调整光路步骤。该系统的光路一致性组件采用光束偏转法对探针位置与偏转进行放大与监测,并使用高精度位移与角度调节平台进行探针相对于探针夹的方位调整。通过实物搭建对探针一致性效果进行了验证,并对紫外光(Ultraviolet,UV)胶水固化过程导致探针位置偏移影响;探针不同偏移量时产生的探测器噪音对AFM系统成像质量影响进行了系统分析。实验结果表明:经由该系统装配的探针平均位置精度接近1.1μm;并且在AFM系统中更换一致性探针仅需8 s。该系统实现了高精度且质量稳定的探针一致性装配,极大地简化了AFM系统重新校准光路的操作步骤,其与自动换针装置配合可有效提升工业计量型AFM的操作与测量性能。
文摘Applications of Atomic Force Microscopy (AFM) in optical disc technology are summarized. AFM is ideally suited to the characterization of nanometerscale pit and bump structures in CD/DVD manufacturing, so the relationship between production variables and pits/bumps geometry as well as relations between pits/bumps geometry and electrical performance of discs can be established to perform direct quality control of CD/DVD manufacturing. Applications of AFM in optical disc technology mainly fall into three parts: qualitative analysis of topography of discs/stampers, semiquantitative analysis of pits/bumps geometry of discs/stampers and length analysis of data marks on bump with statistics technology. Qualitative analysis of topography of discs/stampers and semiquantitative analysis of pits/bumps geometry of discs/stampers are chiefly oriented to the measurements of high error rate at beginning of play, pit morphology and block error rate, track pitch variations, pit depth monitoring as well as bump morphology and its surface roughness. It is discovered that the efficiency of the cooling channels of the mold has deteriorated, resulting in the discs being separated from the stamper while they are too soft due to inadequate cooling in the area where high error rate and block error rate are frequently produced. Length analysis of data marks with statistics technology is aimed at the analysis of track pitch and pitch variation, bump length (offset, deviation, asymmetry) and AFM jitter, bump width and width variation, bump height and height variation as well as side wall angle (slope) and slope variation. Statistical analysis of AFM images yields important information about optical disc microstructure and in turn provides information about the performance of the manufacturing process. It is very useful to analyze geometric parameters by considering the fundamental length groups of the data marks. The obtained results demonstrate that AFM have particular advantages in the quality control of discs/stampers manufacturing.
