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STUDIES OF Cr-O THIN FILNS DEPOSITED BY MULTI-ARC ION PLATING
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作者 WANG Xjangdong, Beijing Vacuum Electronics Research Institute,Beijing 100016, China, and YUAN Lei Beijing Laboratory of Vacuum Physics, Academia Sinica, Beijing 100080, China 《真空科学与技术学报》 EI CAS CSCD 1992年第Z1期107-110,共4页
This paper presents the formation of Cr-O thin films on an iron substrate by multi-arc ion plating, which are intended to be used as a thermal radiation absorbent in electronic vacuum devices. Only oxygen was used as ... This paper presents the formation of Cr-O thin films on an iron substrate by multi-arc ion plating, which are intended to be used as a thermal radiation absorbent in electronic vacuum devices. Only oxygen was used as a reaction gas during deposition, the Cr-O thin film, must have high adhesion and low outgassing rate. The scratch test shows that the critical load, for an applicable Cr-O thin film deposited in oxygen atmosphere alone at a pressure of 8×10<sup>-1</sup> Pa, was as high as 6kg. 展开更多
关键词 CR ion STUDIES OF Cr-O THIN FILNS DEPOSITED BY MULTI-ARC ion plating ARC
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