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VLSI成品率重心游移算法的一个几何解释 被引量:3

A Geometry Explanation of Center of Gravity Algorithm of VLSI Parametric Yield
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摘要 超大规模集成电路 (VL SI)中的参数成品率最优化问题一直是集成电路可制造性设计的重点研究问题 .尽管重心游移算法提出得较早 ,由于其固有的优点目前仍被研究和推广 .文中从一个新的角度 ,即几何学原理上探讨了最优的重心游移算法的原理 。 The maximum problem of parametric yield in VLSI is always an important issue in design for manufacturing (DFM).Although center of gravity algorithm is put forward early,it still be studied and extended due to its inherent advantages.A study of optimal center of gravity from the view of geometry theory is presented,which makes the geometrical image of optimal directional specific.
作者 荆明娥 郝跃
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2004年第5期594-596,共3页 半导体学报(英文版)
基金 国家高技术研究发展计划资助项目~~
关键词 参数成品率 MONTE CARLO方法 重心游移算法 启发式算法 parametric yield Monte Carlo method center of gravity algorithm heuristic algorithm
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参考文献7

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共引文献1

同被引文献36

  • 1王俊平,郝跃.考虑缺陷形状分布的IC成品率模型[J].Journal of Semiconductors,2005,26(5):1054-1058. 被引量:2
  • 2王俊平,郝跃.基于LS空间的IC真实缺陷图像的分割[J].电子学报,2005,33(5):954-956. 被引量:3
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