摘要
本文提出了具有自诊断功能的位定向MARCH-TB算法和字定向MARCH-TBW算法,并且在这两个算法的基础上提出并行测试结构来实现了嵌入式内存的测试和诊断。实验结果表明,此测试算法具有故障覆盖率高,诊断故障能力强,测试需要的时间少等优点。
A self-diagnosis bit-oriented test algorithm (MARCH-TB) and a word-oriented test algorithm (MARCH-TBW) is presented. According to the testing algorithms, A parallel test structure is also proposed to implement the test and diagnose of embedded SRAMs. Experimental results show that the proposed testing algorithms have merits such as high fault coverage, strong diagnostic ability and less testing time.
出处
《电路与系统学报》
CSCD
2003年第5期51-56,共6页
Journal of Circuits and Systems
