摘要
文中主要介绍了叠盖电极技术在SPRITE探测器上的实际应用,并给出了具体实验结果。选择适当的叠盖电极尺寸可以使SPRITE的响应率Rv提高一倍以上,探测率D 普遍提高30%左右,高的可达80%。实验结果表明,叠盖电极技术明显地提高了SPRITE器件的性能,是一种简便的提高SPRITE性能的新途径。
The practical application of the overlapcontacts technology to SPRITE detectors was introduced and the specific results of the experiment were provided in the paper. The responsibility Rv of SPRITE with the applicable length of the overlapcontacts can be doubled and the detectivity D* can be improved about 30%, even 80%. Experimentally, the performance of SPRITE with overlap contacts was markedly increased, so that the overlapcontactstechnology is an effective way to improve the performance of SPRITE.
出处
《激光与红外》
CAS
CSCD
北大核心
2003年第5期331-334,共4页
Laser & Infrared
