摘要
用束箔技术研究氮和氖离子的激发态能级寿命,并把用束箔技术测量的氖离子(Ne Ⅱ)的激发态能级寿命与用相位移技术和用He—Ne等离子体上的强度测量技术得到的结果作了比较。实验数据的分析处理采用CANDY程序。
The results of lifetime for N I and Ne I using the beam - foil technique were compared with those obtained by others using the phase shift technique and the intensity measurement technique on a He -Ne plasma. The experimental data were analysed with a multi -exponential curve - fitting program CANDY.
出处
《核技术》
CAS
CSCD
北大核心
1992年第12期721-724,共4页
Nuclear Techniques
关键词
束箔技术
激发态
氮
氖
离子
Excited state lifetime Beam - foil technique Phase shift techniqueCascade
