摘要
许多电子产品长期处于户外环境下,温度循环是影响其寿命的主要敏感应力。加速寿命试验(Accelerated Life Test,ALT)是实现电子产品寿命快速、高效评估的一种有效手段。针对传统温度循环ALT中温度循环条件设置随机性较大的问题,提出一种温度循环条件下电子产品ALT优化设计方法。在确立加速模型的基础上,将温度循环参数等效为不同的应力,温度循环参数的不同取值等效为不同的应力水平,采用均匀设计方法确定各参数取值的组合方式,以正常应力水平下产品寿命P阶分位数估计的渐近方差最小为优化准则,根据极大似然估计理论建立试验优化设计的数学模型。算例分析表明,该设计方法所得试验方案相比温度循环参数随机组合得到的方案具有更高的估计精度,试验次数更少。该方法为温度循环条件下的ALT设计提供了一种有效途径。
Many electronic products are exposed to outdoor environments for a long time,and thermal cycling is the main sensitive stress that affects their lifespan.Accelerated life test(ALT)is an effective means to rapidly and efficiently assess the life of electronic products.Aiming at the issue of high randomness in the setting of thermal cycling conditions in traditional ALTs,an optimal design method of thermal cycling ALTs for electronic products is proposed.The thermal cycling parameters are equivalently regarded as different stresses,with various parameter values corresponding to different stress levels.A uniform design method is used to determine the combination of parameter values,aiming to minimize the asymptotic variance of the P quantile estimation of the product life under normal stress levels as the optimization criterion.A mathematical model for the optimal design of the thermal cycling ALTs is established based on the maximum likelihood estimation theory.Example analysis shows that the optimal plan obtained from the proposed design method has higher estimation accuracy and fewer experimental times compared to the plan derived from random combinations of thermal cycling parameters.This method provides an effective approach for the design of ALTs under thermal cycling conditions.
作者
侯松高
刘晓娣
HOU Songgao;LIU Xiaodi(Yantai Special Equipment Inspection and Research Institute,Yantai 264001,China;Aviation Foundation College,Naval Aviation University,Yantai 264001,China)
出处
《测控技术》
2025年第8期50-55,共6页
Measurement & Control Technology
