期刊文献+

高辐照度下晶硅光伏电池板隐形缺陷成像系统优化 被引量:1

Optimization of the imaging system for detecting invisible defects on the silicon photovoltaic modules under high irradiance level
在线阅读 下载PDF
导出
摘要 光伏电池板组件的隐形缺陷包括隐裂、碎片、黑斑、阴影等是影响组件发电效率、寿命、安全性的重要因素。为了实现高辐照度下晶硅光伏电池组件隐形缺陷的在线检测,提出了缺陷成像系统的优化方法;包括带通短波红外成像系统组成、双曝光背景抑制、非线性变换图像锐化等。建立了光伏电池板电致或光致发光成像的信号动态范围模型;搭建了基于窄带短波红外InGaAs相机的高辐照度下光伏电池板电致发光成像的实验装置,并对提出的优化方法进行了验证。结果表明,在300W/m~2的辐照度下,本文方法可有效提高光伏电池板隐形缺陷的成像清晰度。 The invisible defects on photovoltaic modules such as cracks,fragments,black spots,and shadings are important to the power efficiency,the lifespan,and the safety of the photovoltaic modules.In order to realize on-site imaging of such defects under high irradiance level,the optimization of the imaging system was proposed,including the band-pass near-infrared imaging system,the double-exposure background-light decrease,and no-linear image sharping.The image dynamic model of the electroluminescence or photoluminescence imaging under high irradiance level was established,and experimental device of the electroluminescence imaging for the silicon photovoltaic modules based on a band-pass InGaAs camera was set up.Experimental results show that the high quality images of the defects on the photovoltaic modules under the irradiance of 300W/m~2 can be obtained by our method.
作者 牛靖凯 翟帅 田欣 魏力中 吴文敏 廖宁放 NIU Jingkai;ZHAI Shuai;TIAN Xin;WEI Lizhong;WU Wenmin;LIAO Ningfang(China Huaneng Clean Energy Research Institute,Beijing 102209,China;China Huaneng Fengdian Energy Company,Inner Mongolia 013650,China;National Laboratory of Color Science and Engineering,School of Optics and Photonics,Beijing Institute of Technology,Beijing 100081,China)
出处 《光学技术》 北大核心 2025年第3期264-268,共5页 Optical Technique
基金 华能集团总部科技项目高辐照度下PL光伏组件缺陷检测装置研制(HNKJ22-H92)。
关键词 光伏电池板 缺陷检测 电致发光成像 光致发光成像 短波红外成像 高辐照度成像 photovoltaic module defects detecting electroluminescence imaging photoluminescence imaging near infrared imaging high irradiance imaging
作者简介 牛靖凯(1993-),男,博士研究生,从事直流变换、微网控制、新能源技术等研究。jk_niu@qny.chng.com.cn;通讯作者:廖宁放(1960-),男,教授,博士,从事颜色科学与图像技术研究。liaonf@bit.edu.cn。
  • 相关文献

参考文献1

二级参考文献7

  • 1TAKAHASHI Y,KAJI Y,OGANE A,et al."Luminoscopy":novel tool for the diagnosis of crystalline silicon solar cells and modules utilizing electroluminescence[C] //Proc of Record of the 2006 IEEE 4th World Conf.Waikoioa,USA,2006:924-927.
  • 2FUYUKI T,KONDO H,YAMAZAKI T,et al.Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence[J].APL,2005,86(26):262108.1-262108.3.
  • 3阙端霖,陈修治.硅材料科学与技术[M].杭州:浙江大学出版社,2001:193-218.
  • 4GREEN M.Silicon solar cells-advanced principles and practice[M].Sydney:UNSW,1995:81-96.
  • 5施敏.半导体器件物理工艺[M].赵鹤鸣,译.苏州:苏州大学出版社,2002:438-447.
  • 6GREEN M A.应用光伏学[M].施正荣,译.上海:上海交通大学出版社,2008:44-48.
  • 7CHUNDURI S K.Displaying defects-market survey on Iuminescence imaging systems[J].Photon Int,2009,1:150-160.

共引文献11

同被引文献11

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部