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扫描路径和预热温度对激光选区熔化成形AlSi10Mg合金残余应力的影响

Effects of Scanning Path and Preheating Temperature on Residual Stress of AlSi10Mg by Selective Laser Melting
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摘要 通过有限元模拟了激光选区熔化成形AlSi10Mg合金在不同扫描路径和预热温度下的残余应力变化趋势。结果表明,相比于扫描路径,预热温度对AlSi10Mg残余应力的影响更为显著。随着基板预热温度从80℃上升至300℃,温度场分布更加均匀,残余应力最高降低了42.7%。与长路径扫描方式相比,短路径扫描方式的温度梯度与温度标准差更小,残余应力也更低。 The finite element method was used to simulate the variation tendency of residual stress of AlSi10Mg processed by selective laser melting based on different scanning paths and preheating temperature.The results indicate that compared with the scanning path,preheating temperature has a more significant effect on the residual stress of AlSi10Mg.With the preheating temperature of the substrate increased from 80℃ to 300℃,the temperature field distribution becomes more uniform and the maximum residual stress is decreased by 42.7%.Compared with the long-path scanning mode,the short-path scanning mode has a smaller average temperature gradient and temperature standard deviation with a lower residual stress.
作者 蒋军杰 王永彪 樊江磊 傅广 王鹏鹏 周放 JIANG Junjie;WANG Yongbiao;FAN Jianglei;FU Guang;WANG Pengpeng;ZHOU Fang(College of Mechanical and Electrical Engineering,Zhengzhou University of Light Industry,Zhengzhou 450002;State Key Laboratory of Public Big Data,Guizhou University,Guiyang 550000)
出处 《特种铸造及有色合金》 CAS 北大核心 2024年第11期1504-1510,共7页 Special Casting & Nonferrous Alloys
基金 河南省科技攻关资助项目(222102230118,222102240053,232102220081) 河南省高等学校重点科研资助项目(23A460016,22A460033)。
关键词 激光选区熔化 AlSi10Mg 扫描路径 预热温度 残余应力 Selective Laser Melting AlSi10Mg Scanning Path Preheating Temperature Residual Stress
作者简介 第一作者:蒋军杰,男,1990年出生,讲师,E-mail:jiangjunjie@zzuli.edu.cn。
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