摘要
应用粉末压片制样-X射线荧光光谱法测定了高钛高炉渣中SiO2、CaO、TiO2等8项化学组成。取过0.125mm筛孔的网筛样品,在25MPa压力下保持30s的条件下制成样片,供X射线荧光光谱分析。分析中选择工作电压为50kV,工作电流为40mA,解决了高含量组分(Si、Ca、Ti)所造成的信号与噪声不易有效分离的问题。按所提出方法分析了高、中、低不同含量的炉渣样品,所测得结果表明方法具有较好的精密度和准确性。与熔融制样-X射线荧光光谱法所测得结果相比,相对误差均在允许范围内。
X-ray fluorescence spectrometry(XRFS)with sample preparation by pressure powder molding was applied to the determination of 8 chemical components(including SiO2,CaO,TiO2 etc.)in high-titanium blast furnace slag.Powdered slag sample with granular size<0.125 mm was taken and pressed under 25 MPa for 30 sto give sample tablet for use in XRFS analysis.A higher working voltage of 50 kV and lower current of 40 mA were chosen for the X-ray tube,to solve the problem of dificulty in separation of analytical signals from interfering noise caused by the high-bearing elements of Si,Ca and Ti.Good precision and accuracy were shown by the results obtained in analysis of slag samples of high,medium and low contents of the analytes by the proposed method.As compared with the results found by XRFS with the fusion sample preparation,values of relative errors obtained were within the allowable limits.
作者
杨再军
YANG Zaijun(Manufacturing Department of Panzhihua Steel & Vanadium Co.t Ltd.,Panzhihua 617000,China)
出处
《理化检验（化学分册）》
CAS
CSCD
北大核心
2019年第4期451-456,共6页
Physical Testing and Chemical Analysis(Part B:Chemical Analysis)
关键词
X射线荧光光谱法
粉末压片
化学成分
高钛型高炉渣
X-ray fluorescence spectrometry
powder tabletting
chemical composition
high titanium blast furnace slag
作者简介
杨再军,工程师,主要从事检测方法优化与实验室管理工作,pzhyzaijun@126.com.
