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厚膜熔断器串电阻并联使用的可靠性研究 被引量:2

Research on the Reliability of Thick-film Fuses Used in Parallel Circuit with Series Resistors
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摘要 以航天工程型号使用的某型厚膜熔断器作为研究对象,对其在串电阻并联使用模式与单只单独使用模式条件下,在不同的过载电流工况下的熔断保护特性和脉冲承载特性的与差异进行了对比研究。结果表明:熔断器中电阻并联使用将为支路上的熔断器起到电流降额作用,同时增大其临界熔断电流值,延长其熔断时间,提高其脉冲承载能力,但不利于快速地切断故障电流。 Taking the thick-film fuses used in aerospace engineering model as research objects, the differences between the fuse protection characteristics and pulse carrying charateristics of the thick-film fuses under different overload current conditions when used in parallel circuit with series resistor and used alone are analyzed. The results show that when the fuse is used in parallel circuit with series resistor, it can play the role of current derating for the fuse on the branch, increase its critical fusing current value, extend its fuse time and increase its pulse carrying capacity, but it is not conducive to cutting off the fault current quickly.
作者 彭昌文 杨成 杨舰 雷巧林 孙鹏远 周婉恬 PENG Changwen;YANG Cheng;YANG Jian;LEI Qiaolin;SUN Pengyuan;ZHOU Wantian(China Zhenhua Group Yunke Electronic Co.,Ltd.,Guiyang 550018,China)
出处 《电子产品可靠性与环境试验》 2018年第5期24-28,共5页 Electronic Product Reliability and Environmental Testing
基金 贵州省科学技术基金项目([2013] 2302)资助
关键词 厚膜熔断器 串电阻 并联使用 可靠性 thick-film fuse series resistor parallel reliability
作者简介 彭昌文(1986-),男,湖北监利人,中国振华集团云科电子有限公司工程师,硕士,主要从事电子元器件的设计与制造方面的研究工作。
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