摘要
The factors influencing the crosstalk of silicon-on-insulator （SO1） nanowire arrayed waveguide grating （AWG） are analyzed using the transfer function method. The analysis shows that wider and thicker arrayed waveguides, outsider fracture of arrayed waveguide, and larger channel space, could mitigate the deterioration of crosstalk. The SOI nanowire AWGs with different arrayed waveguide widths are fabricated by using deep ultraviolet lithography （DUV） and inductively coupled plasma etching （ICP） technology. The measurement results show that the crosstalk performance is improved by about 7 dB through adopting 800 nm arrayed waveguide width.
The factors influencing the crosstalk of silicon-on-insulator （SO1） nanowire arrayed waveguide grating （AWG） are analyzed using the transfer function method. The analysis shows that wider and thicker arrayed waveguides, outsider fracture of arrayed waveguide, and larger channel space, could mitigate the deterioration of crosstalk. The SOI nanowire AWGs with different arrayed waveguide widths are fabricated by using deep ultraviolet lithography （DUV） and inductively coupled plasma etching （ICP） technology. The measurement results show that the crosstalk performance is improved by about 7 dB through adopting 800 nm arrayed waveguide width.
基金
Project supported by the National High Technology Research and Development Program of China(Grant No.2015AA016902)
the National Natural Science Foundation of China(Grant Nos.61274047,61435013,61307034,and 61405188)
the National Key Research and Development Program of China(Grant No.2016YFB0402504)
作者简介
Corresponding author. E-mail： junming@semi.ac.cn
