摘要
采用热等静压技术制备具有胞状强化结构的难熔金属Ta-W-Hf致密块体结构材料,在不同温度下进行高温退火试验研究其结构的稳定性。采用金相显微镜、显微硬度计、XRD等方法研究合金胞状强化结构在高温下的组织演变。结果表明:在1500℃,200MPa下保温1h制得到致密块体胞状强化结构,当保温时间延长为4h时,胞状结构弱化;块体退火温度大于2000℃时,胞状结构基本消失。
The refractory Ta-W-Hf compact bulk structural materials with cell structure were prepared by high temperature isostatic pressing (HIP), and their thermal stability was studied by high temperature annealing at different temperatures. The microstructure evolution of the cell strengthened structure at high temperature was investigated by OM, microhardness tester and XRD. Results show that a compact bulk with cell strengthened structure is obtained by 1500 ℃, 200 MPa for 1 h. However, the cell structure becomes weakened when the holding time is prolonged to 4 h. When the annealing temperature is higher than 2000 ℃, the cell structure almost disappears.
出处
《稀有金属材料与工程》
SCIE
EI
CAS
CSCD
北大核心
2011年第S2期396-399,共4页
Rare Metal Materials and Engineering
基金
国家自然科学基金(50871091)
陕西省自然科学基金(2010JM6003)
