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Physically-based modeling for hole scattering rate in strained Si_(1-x) Ge_x/(100)Si

Physically-based modeling for hole scattering rate in strained Si_(1-x) Ge_x/(100)Si
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摘要 Based on the Fermi's golden rule and the theory of Boltzmann collision term approximation, a physically-based model for hole scattering rate(SR) in strained Si1-x Gex/(100)Si was presented, which takes into account a variety of scattering mechanisms,including ionized impurity, acoustic phonon, non-polar optical phonon and alloy disorder scattering. It is indicated that the SRs of acoustic phonon and non-polar optical phonon decrease under the strain, and the total SR in strained Si1-x Gex/(100)Si also decreases obviously with increasing Ge fraction(x). Moreover, the total SR continues to show a constant tendency when x is less than 0.3. In comparison with bulk Si, the total SR of strained Si1-x Gex/(100) Si decreases by about 58%. Based on the Fermi's golden rule and the theory of Boltzmann collision term approximation, a physically-based model for hole scattering rate(SR) in strained Si1-x Gex/(100)Si was presented, which takes into account a variety of scattering mechanisms,including ionized impurity, acoustic phonon, non-polar optical phonon and alloy disorder scattering. It is indicated that the SRs of acoustic phonon and non-polar optical phonon decrease under the strain, and the total SR in strained Si1-x Gex/(100)Si also decreases obviously with increasing Ge fraction(x). Moreover, the total SR continues to show a constant tendency when x is less than 0.3. In comparison with bulk Si, the total SR of strained Si1-x Gex/(100) Si decreases by about 58%.
出处 《Journal of Central South University》 SCIE EI CAS CSCD 2015年第2期430-436,共7页 中南大学学报(英文版)
基金 Project(JY0300122503)supported by the Research Fund for the Doctoral Program of Higher Education of China Project(P140c090303110c0904)supported by NLAIC Research Fund,China Projects(K5051225014,7214608503)supported by the Fundamental Research Funds for the Central Universities,China
关键词 strained Si1-x Gex biaxial stress hole scattering rate effective mass 物理建模 散射率 应变 硅基 光学声子 空穴 近似理论 散射机制
作者简介 Corresponding author: WANG Bin, PhD; Tel: +86-15991773340; E-mail: wbin@xidian.edu.cn
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