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一种抗单粒子翻转容错异步收发器电路设计 被引量:1

Design of Anti- SEU Fault- tolerant Asynchronous Receiver Transmitter
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摘要 为了改善星载粒子探测装置异步收发器的抗单粒子翻转性能,提出了一种基于Actel Flash FPGA的解决异步收发器抗单粒子翻转和传输过程中检错和纠错问题的高可靠设计方案。基于Actel公司的Pro ASIC Plus系列APA600 FPGA,采用汉明码(Hamming Code)和三模冗余(Triple Modular Redundancy,TMR)法相结合的方式对异步收发器进行容错设计,实现了一种新型的抗单粒子翻转电路。对于发送器模块,首先数据处理单元把发送的数据送到编码器中完成汉明码编码,之后将编码完成的数据分别发送给多数表决器中来表决得到数据送入串行发送器中,最后将并串转换的数据发送出去。对于接收器模块,通过串行接收器对接收数据进行串并转换,并将转换后的并行数据送入解码器,解码器对接收到码字进行译码,得到最终的信息数据。对设计进行误差注入仿真测试,结果表明所设计的容错异步串行收发器能够有效地容错,可以非常方便地应用到航空航天等辐射环境中,实现高可靠的系统设计。 In order to improve the anti-Single Event Upset ( SEU) capability and data communication error de-tection and correction performance of an UART ( Universal asynchronous Receiver and Transmitter) used in a space borne detection equipment, a high-reliable design based on Actel Flash FPGA is proposed.An asyn-chronous receiver/transmitter based on APA600 FPGA of ProASIC Plus architecture,Designed and reinforced with triple module redundancy and Hamming code, is presented in this paper.All modules were developed with triple module redundancy.Data processing unit of the transmitter sends data to Hamming encoder, and the en-coded words are transferred to majority voter, then code words are fed to transmitter.For the receiver, serial re-ceiver transforms the serial data to the parallel data and sends it to the decoder.For the receiver, the serial data was transformed into the parallel data and sent to the decoder by the serial receiver, then, the information can be obtained.The design has been simulated and evaluated by fault injection finally.The results show that the asynchronous serial receiver/transmitter developed can effectively perform fault-tolerant function.It can be ap-plied to a system with high reliability in aerospace radiation environments.
出处 《核电子学与探测技术》 CAS CSCD 北大核心 2014年第7期907-912,916,共7页 Nuclear Electronics & Detection Technology
基金 国家自然科学基金(11005135 11305233)
关键词 Flash FPGA 三模冗余 汉明码 异步收发器 容错 抗辐射 Flash -FPGA triple module redundancy Hamming code asynchronous receiver/transmitter fault-tolerance radiation-hardened
作者简介 杨海波(1987-),男,黑龙江哈尔滨人,博士研究生,研究方向为核电子学研究。
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  • 1Huhtinen M, Faecio F. Computational method to esti- mate Single Event Upset rates in an accelerator envi- ronment [ J ]. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrome- ters, Detectors and Associated Equipment, 2000, 450 (1): 155 -172.
  • 2Hirao T, Mori H, Laird J S, et al. Studies on single -event phenomena using the heavy -ion microbeam at JAERI [ J ]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2003, 210:227-231.
  • 3Smith F. Single event upset mitigation by means of a sequential circuit state freeze [ J ]. Mieroeleetronics Reliability, 2012, 52(6) : 1233 - 1240.
  • 4Banmann R C. Radiation - induced soft errors in ad- vanced semiconductor technologies [ J ]. Device and Materials Reliability, IEEE Transactions on, 2005, 5 (3) : 305 -316.
  • 5Graham P, Caffrey M, Zimmerman J, et al. Conse- quences and categories of SRAM FPGA configuration SEUs[ C]. Proceedings of the 6th Military and Aero- space Applications of Programmable Devices and Technologies International Conference ( MAPLD2003 ) C. 2003, 6: 2003.
  • 6王超,邓平科,林宝军.一种基于Flash型FPGA的高可靠系统设计[J].微计算机信息,2009,25(23):134-135. 被引量:4
  • 7Swift G. Xilinx Single Event Effects, 1 st Consortium Report, Virtex- II Static SEU Characterization [ J ]. Jet Propulsion Laboratory, California Institute of Tech- nology, 2004.
  • 8ProASIC PLUSFlash Family FPGAs v3.0, Actel Cor- poration, 2009.
  • 9Wang J J, Cronquist B, McCoUum J, et al. Single E- vent Effects of a FLASH based FPGA[ C]. SEE Sym- posium, 2002.
  • 10hllen G R, Swirl G M. Single event effects test re- suits for advanced field programmable gate arrays [ C ]. Radiation Effects Data Workshop, 2006 IEEE. IEEE, 2006,11 5 - 120.

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