摘要
通过压片法制备样片 ,用X射线荧光光谱法测量工业硅中铁、铝、钙。探讨了样片制备条件 ,并通过加入粘接剂提高了样片牢固度。用经验系数法进行元素间增强和吸收校正。经对样品制备精密度及测量准确度分析 ,X射线荧光光谱法测量准确度和精密度能满足传统化学法要求。
Fe,Al,Ca in silicon metal were measured by XRF using powder pressed method to prepare the sample. The conditions of preparing the sample disc were discussed, and the strength of the sample disc, was solidified through the binder added. Interelement absorption and enhancement effects are corrected by using the experience coefficient method. The precision and accuracy of the XRF method are excellent as compared with classical chemical method.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
2001年第4期569-571,共3页
Spectroscopy and Spectral Analysis
基金
国家商检局科技基金资助
