摘要
通过研究一些组合电路测试仪器中测试集的生成方式,提出一种融合了编译功能的组合电路测试集生成方式.该测试集生成方式将编译原理与测试集生成算法相结合,解决了组合电路测试仪器中被测芯片类型不易扩充、硬件电路设计复杂等难点问题.从被测芯片的功能表达式入手,详细阐述其词法、语法、语义的分析过程,并以临界通路法为例,给出了该测试集生成方式的详细设计方案,最后根据该设计方案设计出基于STC89C52芯片的组合电路测试系统,并给出了该测试系统的性能测试结果.
By researching the generation of test suite in combinational circuit testing instruments,a generation of combinational circuit test suite combined with compilation feature was proposed.The generation of test suite,which combined the compilers principles with test suite generation algorithm,solving some difficult problems in combinational circuit testing instruments：the type of tested chip is not easy to expand,hardware design circuit is complexity,and so on.This paper starts from the functional expression of tested chip,elaborating the analysis process of the lexical,syntax and semantics in detail.And taking critical path method for example,this paper gives a detailed design scheme of the test suite generation.Finally,according to the design,we designed a combinational circuit test system based on STC89C52 chip,and gave the performance test results of the system.
出处
《郑州大学学报（工学版）》
CAS
北大核心
2014年第2期65-69,共5页
Journal of Zhengzhou University（Engineering Science）
基金
国家自然科学基金青年基金资助项目(31100711)
河北省高等学校科学技术研究青年基金项目(20111122)
关键词
编译原理
临界通路法
组合电路
测试集
compilation principle
critical path method
combinational circuit
test suite
作者简介
李天义（1986-）,男,河北衡水人,河北工业大学研究生,主要从事嵌入式系统及应用研究,E-mail：litianyi2060@163.com.
