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Analysis of delamination in thin film electrodes under galvanostatic and potentiostatic operations with Li-ion diffusion from edge 被引量:4

Analysis of delamination in thin film electrodes under galvanostatic and potentiostatic operations with Li-ion diffusion from edge
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摘要 Progressive delamination driven by Li-ion diffusion in elastic disk-like thin film electrodes of Li-ion batteries is modeled based on the cohesive model. Axisymmetric diffusion model is considered under both galvanostatic and potentiostatic operations. The effect of edge diffusion on the delamination process is evaluated. It is found that the diffusion from edge leads to an earlier delamination initiation. The edge effect is significant for active disks with a small aspect ratio, but negligible for the case of large aspect ratio. The edge diffusion is weaker in the potentiostatic operation than in the galvanostatic operation. Progressive delamination driven by Li-ion diffusion in elastic disk-like thin film electrodes of Li-ion batteries is modeled based on the cohesive model. Axisymmetric diffusion model is considered under both galvanostatic and potentiostatic operations. The effect of edge diffusion on the delamination process is evaluated. It is found that the diffusion from edge leads to an earlier delamination initiation. The edge effect is significant for active disks with a small aspect ratio, but negligible for the case of large aspect ratio. The edge diffusion is weaker in the potentiostatic operation than in the galvanostatic operation.
出处 《Acta Mechanica Sinica》 SCIE EI CAS CSCD 2013年第3期348-356,共9页 力学学报(英文版)
基金 supported by the National Science Foundation of China (11102103 and 11172159) the Shanghai Municipal Education Commission, China (13ZZ070) the Graduate School of Shanghai University (SHUCX120123) the Science and Technology Commission of Shanghai Municipality, China(12ZR1410200)
关键词 Lithium-ion battery · Thin film electrode · De-lamination · Diffusion Lithium-ion battery · Thin film electrode · De-lamination · Diffusion
作者简介 e-mail: jqzhang2@shu.edu.cn
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