摘要
Three ultra-short-period W/B4C multilayers （1.244 nm, 1.235 nm and 1.034 nm） have been fabricated and used for polarization measurement at the 4BTB Beamline at the Beijing Synchrotron Radiation Facility （BSRF）. By using the rotating analyzer ellipsometry method, the linear polarization degree of light emerging from this beamline has been measured and the circular polarization evaluated for 700-860 eV. The first soft X-ray magnetic circular dichroism measurements are carried out at BSRF by positioning the beamline aperture out of the plane of the electron storage ring.
Three ultra-short-period W/B4C multilayers （1.244 nm, 1.235 nm and 1.034 nm） have been fabricated and used for polarization measurement at the 4BTB Beamline at the Beijing Synchrotron Radiation Facility （BSRF）. By using the rotating analyzer ellipsometry method, the linear polarization degree of light emerging from this beamline has been measured and the circular polarization evaluated for 700-860 eV. The first soft X-ray magnetic circular dichroism measurements are carried out at BSRF by positioning the beamline aperture out of the plane of the electron storage ring.
基金
Supported by National Natural Science Foundation of China(11075176, 10435050)
作者简介
E-mail： zyguo@ihep.ac.cnE-mail： cuimq@ihep.ac.cn
