摘要
应用波长扫描X射线荧光光谱仪对粗银中Ag、Au、Cu、Se、Te、Sb、Pb、Pd、Bi九种元素进行测定。运用空白试样系数校正法对各元素的谱线重叠进行校正,理论系数与经验系数相结合对样品基体效应进行校正,有效克服了各元素谱线的背景干扰与基体效应。精密度试验和比对试验表明:该方法分析检测值与化学法检测值相吻合;分析相对标准偏差为0.24%～13.64%,对比分析相对误差为0～13.93%;本方法简单、快速、准确。
Nine components such as Ag,Au,Cu,Se,Te,Sb,Pb,Pd,Bi in crude silver have been measured by sequential wavelength scanning X - ray fluorescence spectrometry. Precision test and comparision test showed in determination of multiple elements in crude silver,testing values of this method were in accordance with testing values by other methods. The RSD was 0.24 - 13.64% The relative error was 0- 13.93%. This method is simple, rapid and accurate.
出处
《铜业工程》
CAS
2012年第6期17-19,51,共4页
Copper Engineering
关键词
X荧光光谱法
粗银
空白样品
背景
基体
成分
X - ray fluorescence spectrometry
crude silver
blank sample
background
matrix
composition
作者简介
龚昌合（1969-），男，江苏徐州人，高级工程师，研究方向为有色金属及稀贵金属冶金分析。E—mail：yygch@tlys.cn
