摘要
随着系统级芯片SoC的集成度越来越高,所需的测试数据量呈指数倍增长,针对测试数据量大这一关键问题,提出了一种有效的基于参考向量和纠错码编码的压缩方案,该方案对测试数据进行三步处理:对测试向量进行分块处理;按照特定的团划分方式选出参考向量;利用纠错码和测试数据相容性的特点对测试数据进行编码。提出的编码具有更短的码字,解压电路结构简单,与同类编码方法相比,该编码能将压缩效率提升至80%,并降低成本。
As the complexity of system-on-a-chip(SoC) has grown rapidly,the amount of test data has increased dramatically.In order to reduce the volume of SoC test data,an improved algorithm is proposed.This method takes full advantage of reference vector and error-correcting code to compress test data.First,the original vectors are divided.Then the reference vector is selected by the designed clique partition.Last,encode the test data by error-correcting and compatible code.The proposed method will result in shorter compressed vectors and simpler structure of decompression circuits.Compared with the other methods,this algorithm reaches higher compression efficiency to 80% and reduces the testing cost.
出处
《国外电子测量技术》
2011年第12期18-21,共4页
Foreign Electronic Measurement Technology
关键词
参考向量
团划分
纠错码
数据压缩
reference vector
clique partition
error-correcting code
data compression
作者简介
陶丽楠，硕士研究生，主要研究方向为测试数据压缩及测试向量生成。
