摘要
针对目前人工检测电子元件外形缺陷的不足,研究了图像处理技术,并以晶振为例,设计了基于图像传感器的电子元件外形检测系统。首先对电子元件准确定位,由CMOS图像传感器采集元件外形的图像信息,并采用全局阈值分割法,用硬件完成图像的二值化处理。单片机将得到的二值化数据逐行扫描,并进行分析与比较,以判断该元件是否存在缺陷。实验表明该方法的检测精度可达到±0.039mm,满足测量的需求,可解决人工检测的不足。
A defect inspection system of electronic components shape based on image sensor was designed for the shortcomings of manual inspection,and the oscillator was used as an example.The electronic component was positioned accuratly,its image information was collected by CMOS image sensor.The image was binarization processed by hardware in threshold segmentation mathod.MCU scanned the binary data,then analyzed and compared the data to determine whether the component was defective.The experiment results show that the detection accuracy of this method is up to ± 0.039 mm.It can meet the measurement requirement and solve the shortage of manual inspection.
出处
《仪表技术与传感器》
CSCD
北大核心
2011年第6期52-53,57,共3页
Instrument Technique and Sensor
