摘要
提出一种新的三维轮廓术——对称线性编码轮廓术（ Ｓ Ｌ Ｃ Ｐ），它利用一对称周期线性结构光编码被测物面，并引入相移技术解码轮廓，因而相位求解简单。详细讨论了 Ｓ Ｌ Ｃ Ｐ的原理，并通过实验验证了其可行性。
A new 3 D profilometry—Symmetric Linearly Coded Profilometry(SLCP) is put forward in the paper.It adopts a symmetrical periodic linear structured light to code the measured object surface and phase shifting technique is used to decode profile,so the phase solving is simple.The principle of SLCP is discussed in detail in the paper and its feasibility is demonstrated through experiments.
出处
《光电工程》
EI
CAS
CSCD
1999年第3期37-41,共5页
Opto-Electronic Engineering
关键词
线性编码
结构光
相移
轮廓测量
Linear coding,Structured light,Phase shift,Profile measurement. CLC number:TG84
