摘要
本文根据对积分双谱分布特性分析，论证了晶体管爆裂噪声是服从非高斯且非对称分布的，并提出可利用积分双谱方法来检测晶体管爆裂噪声．
Based on the characteristic of the integrated bispectrum,it can be proved that the probability density function of burst noise is non Gaussian and asymmetric.The method of detection on burst noise in transistor using the integrated bispectrum is given in this paper.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1999年第5期99-100,共2页
Acta Electronica Sinica
关键词
晶体管
爆裂噪声
积分双谱
检测
Transistor,Burst noise,Integrated bispectrum
