摘要
有些外形较小或内腔腔体体积较小并且检漏合格的电子产品,进行水汽含量测定时有时会出现样品水汽含量超标现象。为证明现行国家标准中粗检漏试验方法(高温氟油加压检漏法)会对产品出现误判的问题,通过一系列试验和研究,证明了外形较小或内腔腔体体积较小存在漏孔的电子产品,严格按照现行的粗检漏试验方法中规定的样品在空气中干燥有效时间(2±1)min内进行试验,试验得到了多种结果,进而对产品形成误判,为此对标准中的该试验方法提出了一些新的建议。
Some electronic devices with a tiny external volume or small internal cavities and ventages are eligible in leak test,but the devices are out of the limit in moisture content test.For the sake of proving that there might be a justice miscarriage in the high temperature perfluorocarbon gross leak test method in active national standards,a series of testing and investigations of electronic devices were carried out.And it was testified that some electronic devices with tiny external volume or small designed internal cavities and ventages got the different results after tested within effective time of（2±1）min in accordance with the actual perfluorocarbon gross leak test method. And this phenomenon may result in miscarriages of justice.In allusion to this problem,several suggestions were put forward.
出处
《半导体技术》
CAS
CSCD
北大核心
2010年第11期1099-1101,共3页
Semiconductor Technology
关键词
粗检漏
干燥时间
标准
水汽含量
误判
gross leak test
desiccate time
standard
moisture content
miscarriage of justice
作者简介
宋玉玺（1979-），男，河北保定人，助理工程师，现从事半导体元器件检测及破坏性物理分析工作。
