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Influence of annealing temperature on the performance of Ge film and photon-counting imaging system

Influence of annealing temperature on the performance of Ge film and photon-counting imaging system
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摘要 Compared with the traditional image intensifier with phosphor screen readout,the photon-counting imaging detector with charge induction readout is more beneficial in several aspects(e.g.,good imaging properties and time resolution) to astronomy,reconnaissance,bioluminescence,and materials research.However, the annealing temperature during the tube-making process can affect the properties of the Ge film,and consequently impair the performance of the detector.Therefore,the influence of annealing temperature on Ge film and on the detector is studied in order to determine the crucial parameters.The Ge films are prepared on ceramic and quartz glass by the use of an electron gun.They are analyzed by scanning electron microscope(SEM),high-resistance meter,and X-ray diffraction(XRD).The results show that the optimum substrate and annealing temperature are ceramic plate and 250℃,respectively. Compared with the traditional image intensifier with phosphor screen readout,the photon-counting imaging detector with charge induction readout is more beneficial in several aspects(e.g.,good imaging properties and time resolution) to astronomy,reconnaissance,bioluminescence,and materials research.However, the annealing temperature during the tube-making process can affect the properties of the Ge film,and consequently impair the performance of the detector.Therefore,the influence of annealing temperature on Ge film and on the detector is studied in order to determine the crucial parameters.The Ge films are prepared on ceramic and quartz glass by the use of an electron gun.They are analyzed by scanning electron microscope(SEM),high-resistance meter,and X-ray diffraction(XRD).The results show that the optimum substrate and annealing temperature are ceramic plate and 250℃,respectively.
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2010年第4期361-364,共4页 中国光学快报(英文版)
基金 supported by the National Natural Science Foundation of China under Grant No.10878005
关键词 Ceramic materials Detectors Electron beams Electron guns GERMANIUM Imaging systems Optoelectronic devices Oxide minerals PHOTONS QUARTZ Scanning electron microscopy X ray diffraction Ceramic materials   Detectors   Electron beams   Electron guns   Germanium   Imaging systems   Optoelectronic devices   Oxide minerals   Photons   Quartz    Scanning electron microscopy   X ray diffraction
作者简介 E-mail:free.ff@163.com
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