摘要
In order to optimize test flow after the default flow is modified by a tester, a new software framework for the radar fault isolation is illustrated. This framework separates all mapping algorithms from test flows so as to modify flow and to insert mapping algorithm dynamically in testing process. Based on this framework, a kind of optimization method of test flow is proposed and studied. By defining an objective function, we can evaluate all candidate test flows so as to get an optimized flow. An example explains how to search the flow from candidate flows.
In order to optimize test flow after the default flow is modified by a tester, a new software framework for the radar fault isolation is illustrated. This framework separates all mapping algorithms from test flows so as to modify flow and to insert mapping algorithm dynamically in testing process. Based on this framework, a kind of optimization method of test flow is proposed and studied. By defining an objective function, we can evaluate all candidate test flows so as to get an optimized flow. An example explains how to search the flow from candidate flows.
作者简介
Zhi-Hua Li was born in Jiangsu Province, China, in 1965. He received the B.S. degree, M.S. degree, and Ph.D degree all in electrical engineering from the Hohai University, Nanjing, in 1986, 1994, and 2008, respectively. He is currently an associate professor with the College of Electrical Engineering, Hohai University. His research interests include fault diagnosis of electronic system and artificial intelligence.（e-mail： zhli@hhu.edu.cn）.Qing Zheng was born in Jiangsu Province, China, in 1964. He received the M.S. degree in electronic engineering from the Southeast University, Nanjing, in 1996. He is currently a senior engineerg with Nanjing Research Institute of Electronics Technology. His research interests include fault diagnosis of electronic system.Xiao-An Song was born in Shandong Province, China, in 1974. He received the M.S. degree in electrical engineering from the Hohai University, Nanjing, in 2005. He is currently an engineer with Nanjing Research Institute of Electronic Technology. His research interests include fault diagnosis of electronic system.
