摘要
阐述了透射电镜中碳膜的制备方法，并讨论了影响碳膜质量的因素；用这种碳膜支持纳米颗粒在透射电镜下观察，碳膜在电子束的长时间照射下，不发生变形和起皱，图象清晰，衬度均匀。
The preparation method of carbon film in transmission electron microscopy(TEM) was stated. The influence factors on quality of carbon film were discussed. The carbon film was used for supporting nanometer powders. When it was irradiated by electron beam for long time in TEM, the carbon film was not deformation and not wrinkle. The image of microstructure was clear, and the contrast of the image was uniform.
出处
《分析测试技术与仪器》
CAS
1998年第1期26-28,共3页
Analysis and Testing Technology and Instruments
