摘要
采用微波消解前处理样品,电感耦合等离子体质谱检测,以In作为内标物进行基体效应的补偿,同时测定了甜玉米、去胚甜玉米、甜玉米胚中的V、Cr、Co、Ga、Cd、Sn、Pb7种元素的含量。结果表明:所建立的方法简便、快速、准确,对于所测元素,标准曲线的相关系数r均大于0.99990,相对标准偏差小于4.73%,结果令人满意。
The 7 kinds of trace elements V, Cr, Co, Ga, Cd, Sn, Pb in sweet corn samples were determined by ICP-MS after these samples were digested with microwave digestion. The relative standard deviations （RSD） for these elements are below 4.73%. The correlation coefficient of the standard curve of 7 elements were larger than 0.99990. The proposed method is operational, rapid, sensitive in sweet corn samples with satisfactory results.
出处
《食品科技》
CAS
北大核心
2009年第1期243-244,247,共3页
Food Science and Technology
作者简介
江莉莉（1982-），女，湖北宜昌人，硕士研究生，主要从事农产品深加工的研究工作。
