摘要
为满足惯性约束聚变研究需要工作距离长、测谱范围宽的X射线诊断设备的独特要求,基于凸面反射几何原理研制了一台双通道弯晶谱仪。谱仪利用Si(111)及Qz(10-10)两种弯晶衍射X射线,并通过X射线CCD成功获得谱线图像,测谱范围从0.30 nm到0.65 nm。在激光装置原型诊断实验上得到应用。数据分析的结果证明实测谱线图像与理论模拟基本吻合。
To satisfy the special requirement of the X-ray diagnosis instrument which needs long working distance and wide spectrum measurement in ICF, a new two-channel curved crystal spectrometer has been designed according to the reflecting geometry of convexity. The spectrometer diffracts X-ray by Si（1l1） and Qz（10--10） curved crystals with overlapping coverage of 0.30-0.65 nm, and the spectra are recorded by X-CCD detectors. The spectrometers has been applied to diagnostics with Shenguang-Ⅲ Prototype. Data analysis demonstrates that the spectra of experiment are accord with those of the theoretical simulation.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2008年第4期612-616,共5页
High Power Laser and Particle Beams
基金
国家高技术发展计划项目
关键词
激光等离子体
弯晶谱仪
X射线诊断
CSI
金M带
Laser-produced plasma
Curved crystal spectrometers X-ray diagnosis
CsI
Gold M-band emission
作者简介
陈盛标（1981-），男，硕士研究生，现从事X射线诊断研究；csb1331@tom．com。
联系作者：蒋刚（1965-），男，教授，博导，主要从事原子与分子光谱结构研究；gjiang@scu．edu．cn。
