摘要
在证明线性电路中结点电压变化量比值等于结点电压灵敏度比值的基础上,提出了结点电压灵敏度比值法,通过结点电压变化量比值和结点电压灵敏度比值的比对确定电路的故障元件。理论分析和实验结果表明,该方法算法简单、诊断速度快,在可测点受限条件下具有较高的诊断精度,特别适合大规模线性模拟电路的故障诊断和测试。
In this paper, a theorem had been proved that the ratio of voltage variation at different nodes equal to the ratio of voltage sensitivity at corresponding nodes when an element parameter changes in the linear circuits. A new method had been put forward for the analog circuit fault diagnosis based on the theorem. The fault element can be tested after the voltage variation ratios were compared with the voltage sensitivity ratios. The theory analysis and the experimental result shows that the algorithm of the new method has simple construction and high calculating speed. The method can raise the accuracy of circuit fault diagnosis when the test nodes are limited. It is very practical for the large-scale linear analog circuit fault diagnosis and testing.
出处
《微电子学与计算机》
CSCD
北大核心
2008年第1期52-57,共6页
Microelectronics & Computer
关键词
模拟电路
故障诊断
电压灵敏度
analog circuit
fault diagnosis
voltage sensitivity
作者简介
许军,女，（1961-），博士，教授。研究方向为检测技术与电路故障诊断。
