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高分辨率MPT全谱仪的研制及性能测试 被引量:10

Development of a High Resolution Simultaneous Microwave Plasma Torch Spectrometer
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摘要 研制了采用模块化设计的高分辨率MPT全谱仪。新研制的MPT全谱仪采用了全内置连续可调微波功率源、中阶梯光栅分光和紫外增强面阵CCD检测等多项先进技术,该仪器具有分辨率高、检测波长范围宽、灵敏度高、模块化等优点。对该仪器对26种元素检出限、光谱分辨率、多元素同时检测及实际样品测定等的考察表明其结果令人满意。 A unique high resolution simultaneous microwave plasma torch (MPT) atomic emission spectrometer was developed and studied preliminarily. Some advanced technologies were applied to the spectrometer, such as echelle grating, UV-intensified CCD array detector, adjustable microwave generator, and water cooling system for the generator, etc. The detection limits of the spectrometer for some elements were determined, the spectral resolution and pixel resolution of the spectrometer were calcu- lated, and an analysis of a practical sample was carried out. The preliminary results demonstrate that such simultaneous spectrometer has advantages of saving sample and time, possessing high sensitivity and resolution, and low-cost for the purchase and maintenance. Taking analytical figures of merit into consideration, the high resolution simultaneous MPT spectrometer will have extended application areas and greater competition potential as compared with sequential MPT spectrometers.
出处 《光谱学与光谱分析》 SCIE EI CAS CSCD 北大核心 2007年第11期2375-2379,共5页 Spectroscopy and Spectral Analysis
基金 吉林省科技发展项目(2001306-1)资助
关键词 MPT全谱仪 高分辨率 中阶梯光栅 CCD检测器 Simultaneous MPT High resolution Echelle grating CCD array detector
作者简介 姜杰,1978年生,吉林大学化学学院博士研究生 通讯联系人e-mail:qhjin@jlu.edu.cn
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