摘要
以碘化铵、硫酸钠、硫粉、碳粉、氧化钙、二氧化硅混合物为缓冲剂，深孔电极，截取曝光，以谱带背景作内标，一次摄谱同时测定化探样品中As、Sb、Bi、Ag、Pb、Cd、Tl、Sn等微量元素。方法精密度（RSD，n=10）为1．2％-5．0％，检出限为0．013—1．0μg／g。方法经国家一级标准物质验证，测定结果与标准值基本相符。
A method for the spectrometric determination of trace volatile elements, including As, Sb, Bi, Ag, Pb, Cd, Tl, Sn, in geochemical exploration samples with deep hole electrode carrier distillation was developed. The mixture of ammonia iodide, sodium sulfate, sulfur powder, carbon powder, calcium oxide and silicon dioxide was selected as a buffer and the spectra were obtained by single cutting-out exposure with band background as internal standard. The detection limits for the elements are 0. 013 - 1.0 μg/g. The precision of the method for these elements is 1.2% ～ 1.5% RSD （ n = 10）. The method has been applied to the determination of these elements in National Standard Reference Materials and the results are in agreement with certified values.
出处
《岩矿测试》
CAS
CSCD
2007年第5期425-427,共3页
Rock and Mineral Analysis
关键词
深孔电极载体蒸馏法
发射光谱
易挥发元素
deep hole electrode carrier distillation method
emission spectrum
volatile element
作者简介
熊艳（1961-），女，四川邛崃人，工程师，从事岩矿测试工作。E-mail：xiongyan0328@sina．com。
