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X光高分辨探测用CsI(Tl)晶体的蒙特卡罗模拟研究 被引量:5

Study on CsI(Tl) Scintillating Crystal for X-Ray High-Resolution Detection with Monte Carlo Method
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摘要 提出了一种基于CsI(Tl)闪烁晶体和面阵CCD器件、采用光纤和光纤面板进行光耦合及传输、以扇形束线阵扫描方式实现对X光高分辨探测的方案。CsI(Tl)晶体的尺寸大小将直接影响到晶体的发光效率及X光的高分辨探测,据此开展了蒙特卡罗模拟研究。模拟研究了X射线能量、X射线源到探测晶体的距离(源距)、CsI(Tl)晶体的厚度与X射线能量分布、全能峰效率与CsI(Tl)闪烁晶体转换效率之间的关系。结果表明,当X射线能量为120~450keV,CsI(Tl)晶体尺寸厚度为0~1.5cm变化时,全能峰效率的变化范围为31.34~96.74%,CsI(Tl)闪烁晶体的转换效率的变化范围为12.8~97.43%。可见,X射线的能量及CsI(Tl)闪烁晶体尺寸的厚度,是决定X光高分辨探测的重要参量,这对优化X光高分辨探测用CsI(Tl)晶体的尺寸设计具有一定的参考价值。 A X-ray detector, based on the CsI(Tl) scintillating crystal and area-array CCD, using fiber and fiber optic plate to couple and transmit light with fan-beam linear array scanning, has been put forth. The luminescent efficiency and X-ray high-resolution detection are directly influenced by the dimension of CsI(Tl) scintillating crystal, and Monte Carlo method is adopted to simulate the influences, including the relations between the energy of X-ray, the distance between X-ray source and the scintillating crystal, and the thickness of CsI(Tl) crystal and the X-ray energy distribution, and then the whole energy peak efficiency and the transition efficiency. The results show that while the X-ray energy is of 120-450 keV, and the thickness of CsI(Tl) crystal is 0.3-1.5 cm, the whole energy peak is within the range of 31.34 % -96.74 %, and the transition efficiency is within the range of 12.8 % - 97.43 %. So, the X-ray energy and the dimension of CsI (Tl) scintillating crystal are the most important parameters determining the X-ray high resolution detection. It has certain referenced values to optimize the dimension design of CsI(Tl) scintillating crystal for X-ray high resolution detection.
出处 《光学学报》 EI CAS CSCD 北大核心 2006年第9期1429-1434,共6页 Acta Optica Sinica
基金 国家自然科学基金(60172074)资助课题
关键词 X射线光学 工业计算机X射线层析术无损检测技术 X射线高分辨探测 CsI(Tl)闪烁晶体 蒙特卡罗方法 X-ray optics industrial X-ray computerized tomography non-destructive testing X-ray high-resolutiondetection, CsI(Tl) scintillating crystal, Monte Carlo method
作者简介 魏彪(1963-),男,浙江桐乡人,重庆大学教授,博士后,主要从事光电检测与成像技术方面的研究。E-mail:weibiao1963@163.com。
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共引文献35

同被引文献50

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