期刊文献+

AlGaN材料的MOCVD生长研究 被引量:1

AlCaN Films Grown on C-plane Sapphire by Metalorganic Chemical Vapor Deposition
在线阅读 下载PDF
导出
摘要 文章研究了A lGaN材料的MOCVD生长机制。在位监控曲线表明,A lGaN材料生长过程是由三维生长逐渐过渡到二维生长,由于A l原子表面迁移率太小,随着TMA l流量的增加,需要更长的时间才能出现二维生长,材料质量也随着A l组分的增加而下降,A lGaN的表面形貌也变差。随着TMA l流量的增加,A lGaN材料的生长速率反而下降,这是由于A l原子阻止了Ga原子参与材料生长。实验还发现,由于TMA l与NH3之间存在强烈的寄生反应,A lGaN材料中的A l组分远小于气相中的A l组分。文中简单探讨了提高A lGaN材料质量的生长方法。 The growth of AIGaN films on sapphire substrate by metalorganic chemical vapor deposition are investigated. Through studying the traces of in situ optical reflectivity,we have observed that the quasi two-dimensional growth of AlGaN occurred followed by three-dimensional growth in the initial stage. Due to low surface mobility of Al atoms, it will take more time to transfer the two-dimensional growth into three-dimentional growth in the process. Since there are parasitic reaction of TMAl and NH3, the Al content in solid phase is much less than that in vapor phase. We have also found that the growth rate of AlGaN decrease with increasing the flux of TMAl, this may be attribute to the siteblocking effect in which the competitive adsorption of TMAl decreases the TMGa reaction with NH3 on the surface. The possible method of improving the AlGaN quality is discussed.
出处 《激光与红外》 CAS CSCD 北大核心 2005年第11期873-876,共4页 Laser & Infrared
关键词 ALGAN MOCVD 材料生长 寄生反应 AlGaN MOCVD Material growth Parasitic reaction
作者简介 赵德刚(1972-),男,副研究员,博士,目前主要从事GaN材料生长与器件研究.
  • 相关文献

参考文献10

  • 1Theodoros G Mihopoulos,Vijay Gupta,Klavs F Jensen. A reaction-transport model for AlGaN MOVPE growth [ J ].J. Crystal Growth,1998,195:733.
  • 2O Makino, K Nakamura,A Tachibana, et al. Applied Surface Science,2000,159 - 160: 374.
  • 3C F Shih, N C Chen, S Y Lin, et al. AlGaN films grown on(0001) sapphire by a two-step method[J]. Appl. Phys.Lett. ,2005,86:211103.
  • 4M D Bremser, W G Perry, T Zheleva, et al. Growth, Doping and Characterization of AlxGal-xN Thin Film Alloys on 6H-SiC (0001) Substrates [ M ]. MRS Int. J. Nitride Semicond. Res. 1996,1:8.
  • 5H Heinke, V Kirchner, S Einfeldt, et al. X-ray diffraction analysis of the defect structure in epitaxial GaN [J]. Appl. Phys. Lett. ,2000,77:2145.
  • 6J Han,T B Ng, R M Biefeld, et al. The effect of H2 on morphology evolution during GaN metalorganic chemical vapor deposition[ J]. Appl. Phy. Lett. ,1997,71:3114.
  • 7D G Zhao, J J Zhu, Z S Liu, et al. Surface morphology of AlN buffer layer and its effect on GaN growth by metalorganic chemical vapor deposition [J]. Appl. Phys. Lett. ,2004,85:1499.
  • 8P Fini, X Wu, E J Tarsa, et al. The effect of growth environment on the morphological and extended defect evolution in GaN grown by metalorganic chemical vapor deposition[ J]. Jpn. J. Appl. Phys. , 1998,37:4460.
  • 9O Briot, J P Alexis, B Gil, et al. Growth kinetics and structural quality in GaN epitaxy by low pressure MOVPE[J]. Mater. Res. Soc. Symp. Proc. , 1996,395:207.
  • 10J Han,J J Figiel. M H Crawford,et al. OMVPE growth and gas-phase reactions of AlGaN for UV emitters [J]. J. Crystal Growth, 1998,195:291.

同被引文献8

  • 1刘斌,张荣,谢自力,张禹,李亮,张曾,刘启佳,姚劲,周建军,姬小利,修向前,江若琏,韩平,郑有炓,龚海梅.MOCVD生长不同Al组分AlGaN薄膜[J].激光与红外,2007,37(B09):964-966. 被引量:2
  • 2Nanjo, T.,Imai, A.,Suzuki, Y.,Abe, Y.,Oishi, T.,Suita, M.,Yagyu, E.,Tokuda, Y.AlGaN Channel HEMT With Extremely High Breakdown Voltage. Electron Devices, IEEE Transactions on . 2013
  • 3H. Hardtdegen,P. Giannoules.??An outstanding innovation in LP-MOVPE: use of nitrogen as the carrier gas(J)III-Vs Review . 1995 (3)
  • 4Xiaoliang Wang,Guoxin Hu,Zhiyong Ma,Junxue Ran,Cuimei Wang,Hongling Xiao,Jian Tang,Jianping Li,Junxi Wang,Yiping Zeng,Jinmin Li,Zhanguo Wang.??AlGaN/AlN/GaN/SiC HEMT structure with high mobility GaN thin layer as channel grown by MOCVD(J)Journal of Crystal Growth . 2006
  • 5Comparison of hydrogen and nitrogen as carrier gas for MOVPE growth of GaN(J)Journal of Crystal Growth . 1998
  • 6Shen, L.,Coffie, R.,Buttari, D.,Heikman, S.,Chakraborty, A.,Chini, A.,Keller, S.,DenBaars, S.P.,Mishra, U.K.High-power polarization-engineered GaN/AlGaN/GaN HEMTs without surface passivation. Electron Device Letters IEEE . 2004
  • 7Arulkumaran, S.,Egawa, T.,Ishikawa, H.,Jimbo, T.Characterization of different-Al-content AlxGa1-xN/GaN heterostructures and high-electron-mobility transistors on sapphire. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures . 2003
  • 8王兵,李志聪,姚然,梁萌,闫发旺,王国宏.GaN基发光二极管外延中p型AlGaN电子阻挡层的优化生长[J].物理学报,2011,60(1):473-478. 被引量:2

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部